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Title: Gold Electrodes
Description: Micrograph of recession and clumping in gold electrodes after NIST researchers applied 1.7 volts of electricity to the carbon nanotube wiring for an hour. The NIST reliability tests may help determine whether nanotubes can replace copper wiring in next-generation electronics.

*MML

See also http://www.nist.gov/mml/materials_reliability/cnt-081611.cfm.
Subjects (names):
Topics/Categories:
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: M. Strus/NIST
AV Number: 11MML026
Date Created: 2011
Date Entered: 8/16/2011

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