72 DPI Image
150 DPI Image
300 DPI Image
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| Title: |
Gold Electrodes |
| Description: |
Micrograph of recession and clumping in gold electrodes after NIST researchers applied 1.7 volts of electricity to the carbon nanotube wiring for an hour. The NIST reliability tests may help determine whether nanotubes can replace copper wiring in next-generation electronics.
*MML
See also http://www.nist.gov/mml/materials_reliability/cnt-081611.cfm.
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| Subjects (names): |
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| Topics/Categories: |
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| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: M. Strus/NIST |
| AV Number: |
11MML026 |
| Date Created: |
2011 |
| Date Entered: |
8/16/2011 |
