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Title: Nanomechanical measurements
Description: Nanomechanical measurements (model system and microimage of typical specimen). a) thin rigid film on elastic substrate b) initial strain induces surface wrinkles parallel to stress c) additional strain induces regular pattern of cracks in the film d) typical specimen imaged with optical profilometer (280 X 210 micrometers.)

*MML
Subjects (names):
Topics/Categories: Nanotechnology--Basic
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: Chung, Lee/NIST
AV Number: 11MML023
Date Created: 2011
Date Entered: 7/19/2011

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