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Title: Ultrafast Single-Photon Detector
Description: Colorized micrograph of an ultrafast single-photon detector made of superconducting nanowires. NIST researchers use electron beam lithography to pattern the nanowires (vertical lines) on a thin film of tungsten-silicon alloy, which produces more reliable signals than the niobium nitride material used previously.

*PML
Subjects (names):
Topics/Categories: Physics--Optics
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: Baek/NIST
AV Number: 11PML058
Date Created: 2011
Date Entered: 6/30/2011

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