72 DPI Image
150 DPI Image
300 DPI Image
|
| Title: |
Ultrafast Single-Photon Detector |
| Description: |
Colorized micrograph of an ultrafast single-photon detector made of superconducting nanowires. NIST researchers use electron beam lithography to pattern the nanowires (vertical lines) on a thin film of tungsten-silicon alloy, which produces more reliable signals than the niobium nitride material used previously.
*PML
|
| Subjects (names): |
|
| Topics/Categories: |
Physics--Optics
|
| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: Baek/NIST |
| AV Number: |
11PML058 |
| Date Created: |
2011 |
| Date Entered: |
6/30/2011 |
