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Title: Atomic Force Microscope
Description: As an atomic force microscope's tip degrades, the change in tip size and shape affects its resonant frequency and that can be used to accurately measure, in real time, the change in the tip's shape, thereby resulting in more accurate measurements and images at nanometer size scales.

*MML
Subjects (names):
Topics/Categories:
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: Jason Killgore, NIST
AV Number: 11MML006
Date Created: Unknown
Date Entered: 3/30/2011

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