72 DPI Image
150 DPI Image
No 300 DPI Version
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| Title: |
Atomic Force Microscope |
| Description: |
As an atomic force microscope's tip degrades, the change in tip size and shape affects its resonant frequency and that can be used to accurately measure, in real time, the change in the tip's shape, thereby resulting in more accurate measurements and images at nanometer size scales.
*MML
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| Subjects (names): |
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| Topics/Categories: |
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| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: Jason Killgore, NIST |
| AV Number: |
11MML006 |
| Date Created: |
Unknown |
| Date Entered: |
3/30/2011 |
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