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| Title: |
New X-Ray Microbeam Answers 20-Year-Old Metals Question |
| Description: |
Novel 3-D microbeam experiment enables direct proof of the Mughrabi model of metal stress. Submicron X-ray beam (broad arrow) penetrates a deformed copper single crystal and is diffracted onto a CCD detector. Platinum wire profiler (circle) traverses the sample and successively intercepts diffracted X-rays, providing depth measurement and allowing strains to be measured from individual dislocation cells.
*MSEL, X-ray Probe, Metal Stress, Metal Deformity
See also http://www.nist.gov/public_affairs/techbeat/tb2006_0803.htm#new.
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| Subjects (names): |
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| Topics/Categories: |
Materials--Metallurgy
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| Type: |
Graphic/illustration |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
NIST |
| AV Number: |
06MSEL021 |
| Date Created: |
August 3, 2006 |
| Date Entered: |
8/3/2006 |
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