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Title: Micrographs of a spot of electronics solder
Description: Micrographs of a spot of electronics solder demonstrate how the lithium FIB microscope (left) clearly distinguishes between the lead and tin components. An SEM image (right) captures mainly topological differences. Images show a region approximately 28 micrometers across.

CNST, micrograph, FIB
Subjects (names):
Topics/Categories:
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Twedt/CNST
AV Number: 14CNST003
Date Created: 2014
Date Entered: 5/7/2014

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