Skip Navigation
NIST Image Gallery [skip navigation] Contact NIST go to A-Z subject index go to NIST homepage Search NIST webspace NIST logo--go to NIST Homepage

NIST Image Gallery

Home | About | Browse | Search

Image Gallery : Image Details
thumbnail
 72 DPI Image 
 150 DPI Image 
 300 DPI Image 
Title: TEM
Description: Not a brick wall. Electron microscope image of a cross section of the newly characterized tunable microwave dielectric clearly shows the thick layers of strontium titanate bricks separated by thin mortar lines of strontium oxide that help promote the largely defect-free growth of the bricks.

-PML

See also http://www.nist.gov/pml/electromagnetics/dielectric-110513.cfm.
Subjects (names):
Topics/Categories:
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: TEM image courtesy David Mueller. Color added for clarity by Nathan Orloff.
AV Number: 13PML039
Date Created: Unknown
Date Entered: 11/5/2013

Home | About | Browse | Search