72 DPI Image
150 DPI Image
No 300 DPI Version
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| Title: |
Electron Beam Ion Trap |
| Description: |
Observations made with NIST's Electron Beam Ion Trap indicate that in ions with a strongly positive charge, electrons can behave in ways inconsistent with quantum electrodynamics (QED) theory, which describes electromagnetism. While more experiments are needed, the data could imply that some aspects of QED theory require revision.
*PML
See also http://www.nist.gov/pml/div684/ebit-112712.cfm.
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| Subjects (names): |
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| Topics/Categories: |
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| Type: |
Photo/Color |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: NIST |
| AV Number: |
12PML039 |
| Date Created: |
2012 |
| Date Entered: |
11/27/2012 |
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