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Title: Hybrid Metrology Computer Chip
Description: This tiny silicon pillar, measuring less than 100 nanometers along any of its sides, is the sort of computer chip feature that manufacturers now can measure more precisely with NIST's hybrid metrology method, which can reduce the nagging uncertainties that have long plagued industry's measurement efforts.

*PML

See also http://www.nist.gov/pml/div683/hybrid-090512.cfm.
Subjects (names):
Topics/Categories:
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: NIST
AV Number: 12PML030
Date Created: 2012
Date Entered: 9/5/2012

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