72 DPI Image
150 DPI Image
No 300 DPI Version
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| Title: |
Transmission electron diffraction pattern |
| Description: |
Transmission electron diffraction pattern from from a segment of an indium gallium nitride (InGaN) nanowire about 50 nanometers in diameter taken with an SEM using the new NIST technique clearly shows a unique pattern associated with crystal diffraction. Bottom: Same pattern but with an overlay showing the crystallographic indexing associated with the atomic structure of the material.
*MML
See also http://www.nist.gov/mml/materials_reliability/ebsd-012412.cfm.
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| Subjects (names): |
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| Topics/Categories: |
Nanotechnology--Biology/Health
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| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: Geiss/NIST |
| AV Number: |
12MML004 |
| Date Created: |
2012 |
| Date Entered: |
1/24/2012 |
