72 DPI Image
150 DPI Image
300 DPI Image
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| Title: |
Ion Trap |
| Description: |
Micrograph of NIST ion trap with red dot indicating where a beryllium ion hovers above the chip. The horizontal and vertical lines separate gold electrodes, which are tuned to hold the ion and generate microwave pulses to manipulate it. The chip was used in experiments demonstrating record-low error rates in quantum information processing with a single quantum bit.
*PML
See also http://www.nist.gov/pml/div688/qubit-083011.cfm.
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| Subjects (names): |
|
| Topics/Categories: |
Quantum Physics--Quantum Computing
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| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: NIST |
| AV Number: |
11PML068 |
| Date Created: |
2011 |
| Date Entered: |
8/30/2011 |
