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Title: NIST Nanoscale Dimensioning Technique Wins R&D 100 Award
Description: Ravikiran Attota, a lead researcher in NIST's Precision Engineering Division, won an R&D 100 Award for his development of the Through-Focus Scanning Optical Microscopy (TSOM), which has applications that cut across a range of industries, from biotechnology to semiconductors and photonics.

*MEL
Subjects (names): Attota, Ravikiran
Topics/Categories:
Type: Photo/Color
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Courtesy National Institute of Standards and Technology
AV Number: 10MEL002
Date Created: 2010
Date Entered: 7/21/2010

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