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| Title: |
NIST Nanoscale Dimensioning Technique Wins R&D 100 Award |
| Description: |
Ravikiran Attota, a lead researcher in NIST's Precision Engineering Division, won an R&D 100 Award for his development of the Through-Focus Scanning Optical Microscopy (TSOM), which has applications that cut across a range of industries, from biotechnology to semiconductors and photonics.
*MEL
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| Subjects (names): |
Attota, Ravikiran
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| Topics/Categories: |
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| Type: |
Photo/Color |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Courtesy National Institute of Standards and Technology |
| AV Number: |
10MEL002 |
| Date Created: |
2010 |
| Date Entered: |
7/21/2010 |
