72 DPI Image
150 DPI Image
No 300 DPI Version
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| Title: |
Electric force microscopy; AFM; EFM |
| Description: |
Electric force microscopy can be used to detail structures well below the surface. Left, AFM height image showing the surface of a polyimide/carbon nanotube composite. Right, EFM image revealing the curved lines of subsurface nanotubes.
*BFRL
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| Subjects (names): |
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| Topics/Categories: |
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| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: NIST |
| AV Number: |
10BFRL003 |
| Date Created: |
2010 |
| Date Entered: |
6/23/2010 |
