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| Title: |
Nanotechnology, measurements, atomic scale moire patterns |
| Description: |
Moiré patterns appear when two or more periodic grids are overlaid slightly askew, which creates a new larger periodic pattern. Researchers from NIST and Georgia Tech imaged and interpreted the moiré patterns created by overlaid sheets of graphene to determine how the lattices of the individual sheets were stacked in relation to one another and to find subtle strains in the regions of bulges or wrinkles in the sheets.
*CNST, moire patterns, graphene, atomic scale, interference patterns
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| Subjects (names): |
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| Topics/Categories: |
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| Type: |
Graphic/illustration |
| Source: |
National Institute of Standards and Technology (NIST) |
Credit Line as it should
appear in print: |
NIST |
| AV Number: |
10CNST001 |
| Date Created: |
April 2010 |
| Date Entered: |
4/27/2010 |
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