72 DPI Image
150 DPI Image
300 DPI Image
|
| Title: |
Cold Atoms; Hot Gallium; Focused Ion Beams |
| Description: |
NIST researcher Jabez McClelland makes adjustments on the new magneto-optical trap ion source, capable of focusing beams of ions down to nanometer spots for use as a 'nano-scalpel' in advanced electronics processing.
*CNST
|
| Subjects (names): |
McClelland, Jabez
|
| Topics/Categories: |
Nanotechnology--Nanomanufacturing
|
| Type: |
Photo/Color |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: Holmes, NIST |
| AV Number: |
08CNST003 |
| Date Created: |
2008 |
| Date Entered: |
11/12/2008 |
