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Title: Helium Ion Microscope
Description: In-depth look: An image of gold atoms on tin from a state-of-the-art scanning electron microscope (left) has relatively poor depth of field - only parts of the image are in sharp focus. By contrast, the entire image from a helium ion microscope image (right) is sharp and clear. NIST researchers are studying helium ion microscopes to improve measurements at the nanoscale that are important to the semiconductor and nanomanufacturing industries.

*MEL
Subjects (names):
Topics/Categories: Nanotechnology--Nanomanufacturing
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: NIST
AV Number: 08MEL003
Date Created: 2008
Date Entered: 9/3/2008

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