72 DPI Image
150 DPI Image
300 DPI Image
|
| Title: |
Shyam Sunder |
| Description: |
Dr. Shyam Sunder, NIST lead investigator, answers questions at a news briefing on August 21, 2008, about NIST's three-year study of the collapse of World Trade Center 7.
*BFRL, WTC
|
| Subjects (names): |
Sunder, Shyam |
| Topics/Categories: |
Fire Research--Simulations |
| Type: |
Photo/Color |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Photo by Don Berkemeyer |
| AV Number: |
08BFRL007 |
| Date Created: |
August 21, 2008 |
| Date Entered: |
8/21/2008 |
|
