72 DPI Image
150 DPI Image
No 300 DPI Version
|
| Title: |
Johnson noise thermometry |
| Description: |
Photograph of circuit used in NIST's Johnson noise thermometry system. The system relies on the 'noise' of jiggling electrons as a basis for measuring temperatures. It is extremely precise in part because it is based on the predictable quantum effects of superconducting elements located between the dashed slits on the top and bottom of the chip.
*EEEL
|
| Subjects (names): |
|
| Topics/Categories: |
Electronics--Electromagnetics
|
| Type: |
Photo/Color |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: NIST |
| AV Number: |
08EEEL011 |
| Date Created: |
2008 |
| Date Entered: |
5/30/2008 |
