72 DPI Image
150 DPI Image
300 DPI Image
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| Title: |
Nanoparticles; Microscope Design |
| Description: |
Heart of the orthogonal tracking microscope system developed at NIST is this nanoparticle solution sample well etched in silicon. Careful orientation of the silicon crystal makes it possible to chemically etch angled sides in the well so smooth they act as mirrors. In this configuration, four side views of a nanoparticle floating in solution (left) are reflected up. A microscope above the well sees the real particle (center, right) and four reflections that show the particle's vertical position.
See video
*CNST
See also http://www.nist.gov/public_affairs/techbeat/tbx2008_0310_microscope.htm.
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| Subjects (names): |
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| Topics/Categories: |
Nanotechnology--Nanomanufacturing
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| Type: |
Graphic/illustration |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: NIST |
| AV Number: |
08CNST001 |
| Date Created: |
March 2008 |
| Date Entered: |
3/7/2008 |
