72 DPI Image
150 DPI Image
No 300 DPI Version
|
| Title: |
FET structures; optical micrographs |
| Description: |
Optical micrographs of typical FET structures in the NIST/Penn State/UK experiments show the effect of pretreating contacts to promote organic crystal formation. Treated structure shows crystal structure extending from the rectangular contacts and merging in the channel.
*EEEL
|
| Subjects (names): |
|
| Topics/Categories: |
Electronics--Semiconductors
|
| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: NIST |
| AV Number: |
08EEEL001 |
| Date Created: |
2008 |
| Date Entered: |
2/21/2008 |
