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Title: Atomic Force Microscope
Description: An atomic force microscope normally reveals the topography of a composite material (l.) NIST's new apparatus adds software and electronics to map nanomechanical properties (r.) The NIST system reveals that the glass fibers are stiffer than the surrounding polymer matrix but sometimes soften at their cores.

*EEEL, MSEL

See also http://www.nist.gov/public_affairs/techbeat/tb2007_1212.htm#nanomech.
Subjects (names):
Topics/Categories: Optics
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: DC Hurley/NIST
AV Number: 07EEEL017
Date Created: December 2007
Date Entered: 12/11/2007

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