72 DPI Image
150 DPI Image
No 300 DPI Version
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| Title: |
Atomic Force Microscope |
| Description: |
An atomic force microscope normally reveals the topography of a composite material (l.) NIST's new apparatus adds software and electronics to map nanomechanical properties (r.) The NIST system reveals that the glass fibers are stiffer than the surrounding polymer matrix but sometimes soften at their cores.
*EEEL, MSEL
See also http://www.nist.gov/public_affairs/techbeat/tb2007_1212.htm#nanomech.
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| Subjects (names): |
|
| Topics/Categories: |
Optics
|
| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Credit: DC Hurley/NIST |
| AV Number: |
07EEEL017 |
| Date Created: |
December 2007 |
| Date Entered: |
12/11/2007 |
