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Title: Fatigue Effects in Silicon
Description: Optical micrographs of contact damage in silicon from cyclic stress show progressive damage after (a) 1,000 cycles, (b) 5,000 cycles, (c) 20,000 cycles and (d) 85,000 cycles. Color added for clarity, white circle shows computed size of the contact circle.

*MSEL

See also http://www.nist.gov/public_affairs/techbeat/tb2007_1127.htm#silicon.
Subjects (names):
Topics/Categories: Manufacturing--Automation/Info. Tech
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit: NIST
AV Number: 07MSEL017
Date Created: November 2007
Date Entered: 11/27/2007

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