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| Title: |
Temperature Control Improves NIST X-ray Detector |
| Description: |
Research physicist Terrence Jach prepares to analyze a sample with the NIST X-ray microcalorimeter. Improved temperature sensing and control systems allow the instrument within the gold chamber to the right to detect X-rays characteristic of specific elements over a broad range of energies with higher resolution.
See also http://www.nist.gov/public_affairs/techbeat/tb2005_0713.htm#x-ray.
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| Subjects (names): |
Jach, Terrence
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| Topics/Categories: |
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| Type: |
Photo/Color |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Photo by Gail Porter/NIST |
| AV Number: |
05CSTL015 |
| Date Created: |
July 13, 2005 |
| Date Entered: |
6/1/2007 |
