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Title: New JILA Apparatus Measures Fast Nanoscale Motions
Description: This slow-motion simulation of the JILA nanoscale motion detector shows the wiggling of a floppy metal beam, just 100 nanometers thick, as it is struck by an electric current at the dot. Red indicates the greatest change in position from the rest state.

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Subjects (names):
Topics/Categories: Quantum Physics--Nanoscale Assembly
Type: Graphic/illustration/video
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
K. Lehnert/JILA
AV Number: 07PHY010
Date Created: March 15, 2007
Date Entered: 3/16/2007

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