Skip Navigation
NIST Image Gallery [skip navigation] Contact NIST go to A-Z subject index go to NIST homepage Search NIST webspace NIST logo--go to NIST Homepage

NIST Image Gallery

Home | About | Browse | Search

Image Gallery : Image Details
thumbnail
 72 DPI Image 
 150 DPI Image 
 300 DPI Image 
Title: Carbon Nanotube Purity
Description: A new NIST method for rapidly assessing the quality of carbon nanotubes was evaluated in part by comparing the results to electron micrographs, which revealed uneven composition such as large bundles of nanotubes and impurities such as metallic particles. (Color added.)

*MSEL, carbon nanotube

See also http://www.nist.gov/public_affairs/techbeat/tb2007_0201.htm#nanotube.
Subjects (names):
Topics/Categories: Nanotechnology--Electronics
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
Credit NIST
AV Number: 07MSEL001
Date Created: February 1, 2007
Date Entered: 2/1/2007

Home | About | Browse | Search