72 DPI Image
150 DPI Image
300 DPI Image
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| Title: |
Microscopy, Scanning Photoionization Imagery, SPIM Image |
| Description: |
A false color SPIM image (b) reveals the same physical structure of a gold pattern on glass as an atomic force microscope image (a), but the high intensity regions in the SPIM image indicate that electron ejection is much more efficient at metal edge discontinuities.
*PHY, Boulder, JILA, SPIM, scanning photoionization imagery, microscopy
See also http://www.nist.gov/public_affairs/techbeat/tb2006_1026.htm#hybrid.
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| Subjects (names): |
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| Topics/Categories: |
Nanotechnology--Basic
|
| Type: |
Graphic/scientific data |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
O.L.A. Monti, T.A. Baker, and D.J. Nesbitt/JILA |
| AV Number: |
06PHY049 |
| Date Created: |
October 2006 |
| Date Entered: |
10/26/2006 |
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