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Title: Microscopy, Scanning Photoionization Imagery, SPIM Image
Description: A false color SPIM image (b) reveals the same physical structure of a gold pattern on glass as an atomic force microscope image (a), but the high intensity regions in the SPIM image indicate that electron ejection is much more efficient at metal edge discontinuities.

*PHY, Boulder, JILA, SPIM, scanning photoionization imagery, microscopy

See also http://www.nist.gov/public_affairs/techbeat/tb2006_1026.htm#hybrid.
Subjects (names):
Topics/Categories: Nanotechnology--Basic
Type: Graphic/scientific data
Source: National Institute of Standards and Technology
Credit Line as it should
appear in print:
O.L.A. Monti, T.A. Baker, and D.J. Nesbitt/JILA
AV Number: 06PHY049
Date Created: October 2006
Date Entered: 10/26/2006

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