72 DPI Image
150 DPI Image
300 DPI Image
|
| Title: |
High-speed, amplified probe tip used to collect reliability data. |
| Description: |
Photo of a high-speed, amplified probe tip used to collect reliability data in the NIST Advanced Device Characterization and Reliability laboratory. Many transistor reliability problems require extremely fast characterization to fully capture fast transient effects. These fast transient effects have become increasingly important for understanding the reliability of advanced transistor technologies. Keeping the distance between the high speed amplifier circuit and the transistor under study very short (< 1 cm) facilitates extremely fast (< 100 ns) transistor characterization.
|
| Subjects (names): |
|
| Topics/Categories: |
Electronics--Semiconductors
|
| Type: |
Photo/Color |
| Source: |
National Institute of Standards and Technology |
Credit Line as it should
appear in print: |
Photo by Erik Secula |
| Date Created: |
December 2011 |
| Date Entered: |
6/26/2012 |
